Sample Fabrication
Substrate
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Spot | Spot size | Laser used | Shooting conditions | Result |
|---|---|---|---|---|
A | 2.5x2.5 mm2, masked | Harvard YAG, 355 nm | 1 shot @ 0.7 J/cm2 |
|
B | 2.5x2.5 mm2, masked | Harvard YAG, 355 nm | 1 shot @ 0.7 J/cm2 |
|
C | 2.5x2.5 mm2, masked | Harvard YAG, 355 nm | 1 shot @ 0.7 J/cm2 |
|
D | 2.5x2.5 mm2, masked | Harvard YAG, 355 nm | 1 shot @ 0.7 J/cm2 | good |
E | 2.5x2.5 mm2, masked | Harvard YAG, 355 nm | 1 shot @ 0.7 J/cm2 | good |
Measurements and processing
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- 6/4/2012 UV-VIS reflection measurement
20120604 UV-VIS reflection Au 1a.Sample.Raw.csv
- 6/5/2012 UV-VIS transmission measurement
20120605 UV-VIS transmission Au 1a.Sample.Raw.csv
- 6/13/2012 Spin photoresist and bake at 115 C for 1 minute to protect sample from debris during laser cut
- 7/10/2012 Retook UV-VIS after tool lamp change
20120709 Au UV-VIS.xlsx
Sample 1B
- 6/13/2012 Spin photoresist and bake at 115 C for 1 minute to protect sample from debris during laser cut
...