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Some of the devices available for I-V characterization include pn diodes, nmos/pmos field effect transistors, and npn/pnp bipolar junction transistors. The user is able to change the operating conditions of the experiment such as bias voltages and currents, compliance values, voltage and current sweep ranges, etc using a simple graphical interface. The results of the experiments are immediately displayed as graphs in the Parameter Analyzer applet console, and can be downloaded as a comma separated file for post processing using matlab or any spread sheet application.
Click to learn more about the Microelectronics Device Characterization Lab.
Below is some educational material based off the Microelectronics Device Characterization lab:
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